• Electrostatic potential mapping at ferroelectric domain walls by low-temperature photoemission electron microscopy 

      Schaab, Jakob; Shapovalov, Konstantin; Schoenherr, Peggy; Hackl, Johanna; Khan, Muhammad Imtiaz; Hentschel, Mario; Yan, Zewu; Bourret, Edith; Schneider, Claus M.; Nemsak, Slavomír; Stengel, Massimiliano; Cano, Andrés; Meier, Dennis (Journal article; Peer reviewed, 2019)
      Low-temperature X-ray photoemission electron microscopy (X-PEEM) is used to measure the electric potential at domain walls in improper ferroelectric Er0.99Ca0.01MnO3. By combining X-PEEM with scanning probe microscopy and ...